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ID 68897
フルテキストURL
fulltext.pdf 28.9 MB
著者
Obayashi, Ippei Center for Artificial Intelligence and Mathematical Data Science, Okayama University
Miyajima, Shinya Faculty of Science and Engineering, Iwate University
Tanaka, Kazuaki Global Center for Science and Engineering, Waseda University
Mayumi, Koichi Institute for Solid State Physics, University of Tokyo
抄録
Contrast variation small-angle neutron scattering (CV-SANS) is a powerful tool for evaluating the structure of multi-component systems. In CV-SANS, the scattering intensities I(Q) measured with different scattering contrasts are de­com­posed into partial scattering functions S(Q) of the self- and cross-correlations between components. Since the measurement has a measurement error, S(Q) must be estimated statistically from I(Q). If no prior knowledge about S(Q) is available, the least-squares method is best, and this is the most popular estimation method. However, if prior knowledge is available, the estimation can be improved using Bayesian inference in a statistically authorized way. In this paper, we propose a novel method to improve the estimation of S(Q), based on Gaussian process regression using prior knowledge about the smoothness and flatness of S(Q). We demonstrate the method using synthetic core–shell and experimental polyrotaxane SANS data.
キーワード
contrast variation small-angle neutron scattering
CV-SANS
partial scattering functions
multi-component systems
statistical methods
Bayesian inference
contrast variation
Gaussian process regression
発行日
2025-06
出版物タイトル
Journal of Applied Crystallography
58巻
3号
出版者
International Union of Crystallography (IUCr)
開始ページ
976
終了ページ
991
ISSN
1600-5767
資料タイプ
学術雑誌論文
言語
英語
OAI-PMH Set
岡山大学
論文のバージョン
publisher
PubMed ID
DOI
関連URL
isVersionOf https://doi.org/10.1107/s1600576725003334
ライセンス
https://creativecommons.org/licenses/by/4.0/legalcode
助成機関名
Japan Science and Technology Agency
Ministry of Education, Culture, Sports, Science and Technology
Japan Society for the Promotion of Science
助成番号
JPMJFR2120
JPMJFR202S
JPMXP1122714694
JP 20H05884
JP 22H05106