
| ID | 68897 |
| フルテキストURL | |
| 著者 |
Obayashi, Ippei
Center for Artificial Intelligence and Mathematical Data Science, Okayama University
Miyajima, Shinya
Faculty of Science and Engineering, Iwate University
Tanaka, Kazuaki
Global Center for Science and Engineering, Waseda University
Mayumi, Koichi
Institute for Solid State Physics, University of Tokyo
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| 抄録 | Contrast variation small-angle neutron scattering (CV-SANS) is a powerful tool for evaluating the structure of multi-component systems. In CV-SANS, the scattering intensities I(Q) measured with different scattering contrasts are decomposed into partial scattering functions S(Q) of the self- and cross-correlations between components. Since the measurement has a measurement error, S(Q) must be estimated statistically from I(Q). If no prior knowledge about S(Q) is available, the least-squares method is best, and this is the most popular estimation method. However, if prior knowledge is available, the estimation can be improved using Bayesian inference in a statistically authorized way. In this paper, we propose a novel method to improve the estimation of S(Q), based on Gaussian process regression using prior knowledge about the smoothness and flatness of S(Q). We demonstrate the method using synthetic core–shell and experimental polyrotaxane SANS data.
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| キーワード | contrast variation small-angle neutron scattering
CV-SANS
partial scattering functions
multi-component systems
statistical methods
Bayesian inference
contrast variation
Gaussian process regression
|
| 発行日 | 2025-06
|
| 出版物タイトル |
Journal of Applied Crystallography
|
| 巻 | 58巻
|
| 号 | 3号
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| 出版者 | International Union of Crystallography (IUCr)
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| 開始ページ | 976
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| 終了ページ | 991
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| ISSN | 1600-5767
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| 資料タイプ |
学術雑誌論文
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| 言語 |
英語
|
| OAI-PMH Set |
岡山大学
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| 論文のバージョン | publisher
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| PubMed ID | |
| DOI | |
| 関連URL | isVersionOf https://doi.org/10.1107/s1600576725003334
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| ライセンス | https://creativecommons.org/licenses/by/4.0/legalcode
|
| 助成機関名 |
Japan Science and Technology Agency
Ministry of Education, Culture, Sports, Science and Technology
Japan Society for the Promotion of Science
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| 助成番号 | JPMJFR2120
JPMJFR202S
JPMXP1122714694
JP 20H05884
JP 22H05106
|