
| ID | 34189 |
| フルテキストURL | |
| 著者 |
Hayashi, K
Okayama University
Fukui, Keisuke
Himeji Institute of Technology
Tanaka, Zenzo
Okayama University
Kondo, Kazuo
Okayama University
|
| 抄録 | Metal posts and finer pitch solder bumps are the indispensable microconnectors for chip size packaging and are formed by electrodeposition into deep cavities. It is difficult to stir inside these deep cavities. Natural convection due to density difference is effective in stirring inside cavity with 200 mum cathode width of aspect ratio of one. The bump shape increases toward lower side in a vertical cathode arrangement with placement angle of Theta = 90 degrees. This increase in bump height results from a collision of flow along the lower side of the resist sidewall which enlarges local current and thickens the lower edge of bumps. The effect of natural convection is also evident in the neighboring two cavities of 200 mum cathode width. The natural convection is not effective for cavities with less than 100 mum cathode width. The bump shapes become flat. Only diffusion occurs within these smaller than 100 mum cavities. (C) 2001 The Electrochemical Society. All rights reserved. |
| キーワード | copper bumps
|
| 備考 | Digital Object Identifer:10.1149/1.1346602
Published with permission from the copyright holder. This is the institute's copy, as published in Journal of the Electrochemical Society, March 2001, Volume 148, Issue 3, Pages 145-148. Publisher URL:http://dx.doi.org/10.1149/1.1346602 Direct access to Thomson Web of Science record Copyright © 2001 The Electrochemical Society, Inc. All rights reserved. |
| 発行日 | 2001-03
|
| 出版物タイトル |
Journal of the Electrochemical Society
|
| 巻 | 148巻
|
| 号 | 3号
|
| 開始ページ | 145
|
| 終了ページ | 148
|
| 資料タイプ |
学術雑誌論文
|
| 言語 |
英語
|
| 査読 |
有り
|
| DOI | |
| Web of Science KeyUT | |
| Submission Path | physical_and_theoretical_chemistry/13
|