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ID 34189
フルテキストURL
著者
Hayashi, K Okayama University
Fukui, Keisuke Himeji Institute of Technology
Tanaka, Zenzo Okayama University
Kondo, Kazuo Okayama University
抄録

Metal posts and finer pitch solder bumps are the indispensable microconnectors for chip size packaging and are formed by electrodeposition into deep cavities. It is difficult to stir inside these deep cavities. Natural convection due to density difference is effective in stirring inside cavity with 200 mum cathode width of aspect ratio of one. The bump shape increases toward lower side in a vertical cathode arrangement with placement angle of Theta = 90 degrees. This increase in bump height results from a collision of flow along the lower side of the resist sidewall which enlarges local current and thickens the lower edge of bumps. The effect of natural convection is also evident in the neighboring two cavities of 200 mum cathode width. The natural convection is not effective for cavities with less than 100 mum cathode width. The bump shapes become flat. Only diffusion occurs within these smaller than 100 mum cavities. (C) 2001 The Electrochemical Society. All rights reserved.

キーワード
copper bumps
備考
Digital Object Identifer:10.1149/1.1346602
Published with permission from the copyright holder. This is the institute's copy, as published in Journal of the Electrochemical Society, March 2001, Volume 148, Issue 3, Pages 145-148.
Publisher URL:http://dx.doi.org/10.1149/1.1346602
Direct access to Thomson Web of Science record
Copyright © 2001 The Electrochemical Society, Inc. All rights reserved.
発行日
2001-03
出版物タイトル
Journal of the Electrochemical Society
148巻
3号
開始ページ
145
終了ページ
148
資料タイプ
学術雑誌論文
言語
英語
査読
有り
DOI
Web of Science KeyUT
Submission Path
physical_and_theoretical_chemistry/13