The Dependency of Stress on the Diffraction Plane in thePolycrystalline Metals

The loading and residual stresses measured by using X-ray stress measurment depend on diffraction plane. In order to make clear its cause, the several models on elastic and plastic deformations are developed and the theoretical values are compared with measured ones. It was found that the dependencies of measured stress on the diffraction plane can be explaned by accepting Reuss's model for elastic deformation and Taylor's model for plastic deformation.