| ID | 30053 |
| FullText URL | |
| Author |
Michinishi, Hiroyuki
Okamoto, Takuji
|
| Abstract | A sufficient condition under which a minimum verification test set (MVTS) for a combinational circuit has 2w elements is derived, where w is the maximum number of inputs on which any output depends, and an algorithm to find an NVTS with 2w elements for any CUT with up to four outputs is described |
| Keywords | automatic testing
built-in self test
combinatorial circuits
logic testing
|
| Note | Digital Object Identifier: 10.1109/ATS.1992.224428
Published with permission from the copyright holder. This is the institute's copy, as published in Test Symposium, 1992. (ATS '92), Proceedings., First Asian (Cat. No.TH0458-0), 26-27 Nov 1992, Pages 14-19. Publisher URL:http://dx.doi.org/10.1109/ATS.1992.224428 Copyright © 1992 IEEE. All rights reserved. |
| Published Date | 1992-11-26
|
| Publication Title |
Test Symposium
|
| Start Page | 14
|
| End Page | 19
|
| Content Type |
Journal Article
|
| language |
English
|
| Refereed |
True
|
| DOI | |
| Submission Path | industrial_engineering/63
|
