ID | 30057 |
FullText URL | |
Author |
Shimizu, Toshimi
Michinishi, Hiroyuki
Okamoto, Takuji
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Abstract | In this paper, features of dependence matrices of combinational circuits with five outputs are discussed, and it is shown that a minimum test set for locally exhaustive testing of such circuits always has 2 w test patterns, where w is the maximum number of inputs on which any output depends |
Keywords | combinational circuits
logic testing
matrix algebra
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Note | Digital Object Identifier: 10.1109/ATS.1994.367218
Published with permission from the copyright holder. This is the institute's copy, as published in Test Symposium, 1994., Proceedings of the Third Asian, 15-17 Nov 2006, Pages 280-285. Publisher URL:http://dx.doi.org/10.1109/ATS.1994.367218 Copyright © 1994 IEEE. All rights reserved. |
Published Date | 1994-11-15
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Publication Title |
Test Symposium
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Start Page | 280
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End Page | 285
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Content Type |
Journal Article
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language |
English
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Refereed |
True
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DOI | |
Submission Path | industrial_engineering/60
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