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  <Article>
    <Journal>
      <PublisherName>IARIA</PublisherName>
      <JournalTitle>Acta Medica Okayama</JournalTitle>
      <Issn>1942-2644</Issn>
      <Volume>17</Volume>
      <Issue>3-4</Issue>
      <PubDate PubStatus="ppublish">
        <Year>2024</Year>
        <Month/>
      </PubDate>
    </Journal>
    <ArticleTitle>Deep Reinforcement Learning Enabled Adaptive Virtual Machine Migration Control in Multi-Stage Information Processing Systems</ArticleTitle>
    <FirstPage LZero="delete">116</FirstPage>
    <LastPage>125</LastPage>
    <Language>EN</Language>
    <AuthorList>
      <Author>
        <FirstName EmptyYN="N">Yukinobu</FirstName>
        <LastName>Fukushima</LastName>
        <Affiliation>Faculty of Environmental, Life, Natural Science and Technology Okayama University</Affiliation>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Yuki</FirstName>
        <LastName>Koujitani</LastName>
        <Affiliation>Graduate School of Natural Science and Technology Okayama University</Affiliation>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Kazutoshi</FirstName>
        <LastName>Nakane</LastName>
        <Affiliation>Graduate School of Information Science Nagoya University</Affiliation>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Yuya</FirstName>
        <LastName>Tarutani</LastName>
        <Affiliation>Graduate School of Engineering Osaka University</Affiliation>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Celimuge</FirstName>
        <LastName>Wu</LastName>
        <Affiliation>Graduate School of Informatics and Engineering The Univ. of Electro-Commun.</Affiliation>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Yusheng</FirstName>
        <LastName>Ji</LastName>
        <Affiliation>Information Systems Architecture Research Division National Institute of Informatics</Affiliation>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Tokumi</FirstName>
        <LastName>Yokohira</LastName>
        <Affiliation>Faculty of Interdisciplinary Science and Engineering in Health Systems Okayama University</Affiliation>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Tutomu</FirstName>
        <LastName>Murase</LastName>
        <Affiliation>Graduate School of Information Science Nagoya University</Affiliation>
      </Author>
    </AuthorList>
    <PublicationType/>
    <ArticleIdList>
      <ArticleId IdType="doi"/>
    </ArticleIdList>
    <Abstract>This paper tackles a Virtual Machine (VM) migration control problem to maximize the progress (accuracy) of information processing tasks in multi-stage information processing systems. The conventional methods for this problem are effective only for specific situations, such as when the system load is high. In this paper, in order to adaptively achieve high accuracy in various situations, we propose a VM migration method using a Deep Reinforcement Learning (DRL) algorithm. It is difficult to directly apply a DRL algorithm to the VM migration control problem because the size of the solution space of the problem dynamically changes according to the number of VMs staying in the system while the size of the agentfs action space is fixed in DRL algorithms. To cope with this difficulty, the proposed method divides the VM migration control problem into two problems: the problem of determining only the VM distribution (i.e., the proportion of the number of VMs deployed on each edge server) and the problem of determining the locations of all the VMs so that it follows the determined VM distribution. The former problem is solved by a DRL algorithm, and the latter by a heuristic method. This approach makes it possible to apply a DRL algorithm to the VM migration control problem because the VM distribution is expressed by a vector with a fixed number of dimensions and can be directly outputted by the agent. The simulation results confirm that our proposed method can adaptively achieve quasi-optimal accuracy in various situations with different link delays, types of the information processing tasks and the number of VMs.</Abstract>
    <CoiStatement>No potential conflict of interest relevant to this article was reported.</CoiStatement>
    <ObjectList>
      <Object Type="keyword">
        <Param Name="value">Multi-stage information processing system</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">VM migration control</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">Deep reinforcement learning</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">Deep Deterministic Policy Gradient (DDPG)</Param>
      </Object>
    </ObjectList>
    <ReferenceList/>
  </Article>
  <Article>
    <Journal>
      <PublisherName>Institute of Electrical and Electronics Engineers</PublisherName>
      <JournalTitle>Acta Medica Okayama</JournalTitle>
      <Issn>2169-3536</Issn>
      <Volume>12</Volume>
      <Issue/>
      <PubDate PubStatus="ppublish">
        <Year>2024</Year>
        <Month/>
      </PubDate>
    </Journal>
    <ArticleTitle>A Protection Scheme With Speech Processing Against Audio Adversarial Examples</ArticleTitle>
    <FirstPage LZero="delete">146551</FirstPage>
    <LastPage>146559</LastPage>
    <Language>EN</Language>
    <AuthorList>
      <Author>
        <FirstName EmptyYN="N">Yuya</FirstName>
        <LastName>Tarutani</LastName>
        <Affiliation>Faculty of Interdisciplinary Science and Engineering in Health Systems, Okayama University</Affiliation>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Taisei</FirstName>
        <LastName>Yamamoto</LastName>
        <Affiliation>Graduate School of Interdisciplinary Science and Engineering in Health Systems, Okayama University</Affiliation>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Yukinobu</FirstName>
        <LastName>Fukushima</LastName>
        <Affiliation>Faculty of Environmental, Life, Natural Science and Technology, Okayama University</Affiliation>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Tokumi</FirstName>
        <LastName>Yokohira</LastName>
        <Affiliation>Faculty of Interdisciplinary Science and Engineering in Health Systems, Okayama University</Affiliation>
      </Author>
    </AuthorList>
    <PublicationType/>
    <ArticleIdList>
      <ArticleId IdType="doi"/>
    </ArticleIdList>
    <Abstract>Machine learning technologies have improved the accuracy of speech recognition systems, and devices using those systems, such as smart speakers and AI assistants, are now in wide use. However, speech recognition systems have security vulnerabilities. In particular, a known machine learning vulnerability called audio adversarial examples (AAEs), which causes misrecognition in speech recognition systems, has become a problem. We propose a scheme for using speech processing to protect speech recognition systems from AAEs, preventing misrecognitions by slight processing of input speech that does not affect the recognition of normal speech. We use two kinds of processing: speed and frequency. Evaluation results show that the proposed scheme can reduce the success rate of attack speech to about 1% while maintaining about 85% recognition rates for normal speech.</Abstract>
    <CoiStatement>No potential conflict of interest relevant to this article was reported.</CoiStatement>
    <ObjectList>
      <Object Type="keyword">
        <Param Name="value">Speech recognition system</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">security</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">audio adversarial example</Param>
      </Object>
    </ObjectList>
    <ReferenceList/>
  </Article>
  <Article>
    <Journal>
      <PublisherName>IARIA</PublisherName>
      <JournalTitle>Acta Medica Okayama</JournalTitle>
      <Issn>2308-4413</Issn>
      <Volume/>
      <Issue/>
      <PubDate PubStatus="ppublish">
        <Year>2024</Year>
        <Month/>
      </PubDate>
    </Journal>
    <ArticleTitle>Application of a Deep Reinforcement Learning Algorithm to Virtual Machine Migration Control in Multi-Stage Information Processing Systems</ArticleTitle>
    <FirstPage LZero="delete">13</FirstPage>
    <LastPage>18</LastPage>
    <Language>EN</Language>
    <AuthorList>
      <Author>
        <FirstName EmptyYN="N">Yukinobu</FirstName>
        <LastName>Fukushima</LastName>
        <Affiliation>Okayama University</Affiliation>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Yuki</FirstName>
        <LastName>Koujitani</LastName>
        <Affiliation>Okayama University</Affiliation>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Kazutoshi</FirstName>
        <LastName>Nakane</LastName>
        <Affiliation>Nagoya University</Affiliation>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Yuta</FirstName>
        <LastName>Tarutani</LastName>
        <Affiliation>Okayama University</Affiliation>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Celimuge</FirstName>
        <LastName>Wu</LastName>
        <Affiliation>The Univ. of Electro-Commun.</Affiliation>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Yusheng</FirstName>
        <LastName>Ji</LastName>
        <Affiliation>National Institute of Informatics</Affiliation>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Tokumi</FirstName>
        <LastName>Yokohira</LastName>
        <Affiliation>Okayama University</Affiliation>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Tutomu</FirstName>
        <LastName>Murase</LastName>
        <Affiliation>Nagoya University</Affiliation>
      </Author>
    </AuthorList>
    <PublicationType/>
    <ArticleIdList>
      <ArticleId IdType="doi"/>
    </ArticleIdList>
    <Abstract>This paper tackles a Virtual Machine (VM) migration control problem to maximize the progress (accuracy) of information processing tasks in multi-stage information processing systems. The conventional methods for this problem (e.g., VM sweeping method and VM number averaging method) are effective only for specific situations, such as when the system load is high. In this paper, in order to achieve high accuracy in various situations, we propose a VM migration method using a Deep Reinforcement Learning (DRL) algorithm. It is difficult to directly apply a DRL algorithm to the VM migration control problem because the size of the solution space of the problem dynamically changes according to the number of VMs staying in the system while the size of the agentfs action space is fixed in DRL algorithms. Therefore, the proposed method divides the VM migration control problem into two problems: the problem of determining only the VM distribution (i.e., the proportion of the number of VMs deployed on each edge server) and the problem of determining the locations of all the VMs so that it follows the determined VM distribution. The former problem is solved by a DRL algorithm, and the latter problem is solved by a heuristic method. The simulation results confirm that our proposed method can select quasi-optimal VM locations in various situations with different link delays.</Abstract>
    <CoiStatement>No potential conflict of interest relevant to this article was reported.</CoiStatement>
    <ObjectList>
      <Object Type="keyword">
        <Param Name="value">Multi-stage information processing system</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">VM migration control</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">Deep reinforcement learning</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">Deep Deterministic Policy Gradient (DDPG)</Param>
      </Object>
    </ObjectList>
    <ReferenceList/>
  </Article>
  <Article>
    <Journal>
      <PublisherName/>
      <JournalTitle>Acta Medica Okayama</JournalTitle>
      <Issn/>
      <Volume/>
      <Issue/>
      <PubDate PubStatus="ppublish">
        <Year>2002</Year>
        <Month/>
      </PubDate>
    </Journal>
    <ArticleTitle>CMOS floating gate defect detection using I/sub DDQ/ test with DC power supply superposed by AC component</ArticleTitle>
    <FirstPage LZero="delete">417</FirstPage>
    <LastPage>422</LastPage>
    <Language>EN</Language>
    <AuthorList>
      <Author>
        <FirstName EmptyYN="N">Hiroyuki</FirstName>
        <LastName>Michinishi</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Tokumi</FirstName>
        <LastName>Yokohira</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Takuji</FirstName>
        <LastName>Okamoto</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Toshifumi</FirstName>
        <LastName>Kobayashi</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Tsutomu</FirstName>
        <LastName>Hondo</LastName>
        <Affiliation/>
      </Author>
    </AuthorList>
    <PublicationType/>
    <ArticleIdList>
      <ArticleId IdType="doi"/>
    </ArticleIdList>
    <Abstract>&lt;p&gt;In this paper, we propose a new I/sub DDQ/ test method for detecting floating gate defects in CMOS ICs. In the method, an unusual increase of the supply current, caused by defects, is promoted by superposing an AC component on the DC power supply. The feasibility of the test is examined by some experiments on four DUTs with an intentionally caused defect. The results showed that our method could detect clearly all the defects, one of which may be detected by neither any functional logic test nor any conventional I/sub DDQ/ test.&lt;/p&gt;
</Abstract>
    <CoiStatement>No potential conflict of interest relevant to this article was reported.</CoiStatement>
    <ObjectList>
      <Object Type="keyword">
        <Param Name="value">CMOS logic circuits</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">electric current measurement</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">integrated circuit testing</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">logic testing</Param>
      </Object>
    </ObjectList>
    <ReferenceList/>
  </Article>
  <Article>
    <Journal>
      <PublisherName/>
      <JournalTitle>Acta Medica Okayama</JournalTitle>
      <Issn/>
      <Volume/>
      <Issue/>
      <PubDate PubStatus="ppublish">
        <Year>2005</Year>
        <Month/>
      </PubDate>
    </Journal>
    <ArticleTitle>Performance Improvement of TCP using Performance Enhancing Proxies \ Effect of Premature ACK Transmission Timing on Throughput \</ArticleTitle>
    <FirstPage LZero="delete">7</FirstPage>
    <LastPage>12</LastPage>
    <Language>EN</Language>
    <AuthorList>
      <Author>
        <FirstName EmptyYN="N">Shigeyuki</FirstName>
        <LastName>Osada</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Tokumi</FirstName>
        <LastName>Yokohira</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Wang</FirstName>
        <LastName>Hui</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Kiyohiko</FirstName>
        <LastName>Okayama</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Nariyoshi</FirstName>
        <LastName>Yamai</LastName>
        <Affiliation/>
      </Author>
    </AuthorList>
    <PublicationType/>
    <ArticleIdList>
      <ArticleId IdType="doi"/>
    </ArticleIdList>
    <Abstract>&lt;p&gt;In order to improve TCP performance, a method using a PEP (Perfonnance Enhancing Proxy) is proposed. The PEP operates on a router along a TCP connection. When a data packet arrives at the PEP, it forwards the packet to the destination host, transmits the corresponding ACK (premature ACK) to the source host in behalf of the destination host and stores the copy of the packet into its own buffer (PEP buffer) in case of the retransmission of the packet. In this paper, under the strategy which keeps the number of packets in the PEP buffer for which premature ACKs have been returned being less than or equal to a fixed threshold value (watermark value), we investigate the relation between the watermark value and the maximum throughput. Extensive simulation runs show that the simulation results are roughly classified into two cases. One case is that the maximum throughput becomes larger for larger watermark value and becomes a constant value when the watermark value is over a value. The other case is that though the maximum throughput becomes larger for lager watermark value in the same way, it reversely decreases when the watermark value is over a value. We also show that the latter (former) case is easier to occur as the propagation delay in the input side network ofthe PEP becomes smaller (larger) and the propagation delay in the output side network of the PEP becomes larger (smaller) and the PEP buffer capacity becomes smaller (larger).&lt;/p&gt;
</Abstract>
    <CoiStatement>No potential conflict of interest relevant to this article was reported.</CoiStatement>
    <ObjectList>
      <Object Type="keyword">
        <Param Name="value">PEP</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">Premature ACK</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">TCP</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">watermark</Param>
      </Object>
    </ObjectList>
    <ReferenceList/>
  </Article>
  <Article>
    <Journal>
      <PublisherName/>
      <JournalTitle>Acta Medica Okayama</JournalTitle>
      <Issn/>
      <Volume/>
      <Issue/>
      <PubDate PubStatus="ppublish">
        <Year>1996</Year>
        <Month/>
      </PubDate>
    </Journal>
    <ArticleTitle>A test methodology for interconnect structures of LUT-based FPGAs</ArticleTitle>
    <FirstPage LZero="delete">68</FirstPage>
    <LastPage>74</LastPage>
    <Language>EN</Language>
    <AuthorList>
      <Author>
        <FirstName EmptyYN="N">Hiroyuki</FirstName>
        <LastName>Michinishi</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Tokumi</FirstName>
        <LastName>Yokohira</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Takuji</FirstName>
        <LastName>Okamoto</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Tomoo</FirstName>
        <LastName>Inoue</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Hideo</FirstName>
        <LastName>Fujiwara</LastName>
        <Affiliation/>
      </Author>
    </AuthorList>
    <PublicationType/>
    <ArticleIdList>
      <ArticleId IdType="doi"/>
    </ArticleIdList>
    <Abstract>&lt;p&gt;In this paper we consider testing for programmable interconnect structures of look-up table based FPGAs. The interconnect structure considered in the paper consists of interconnecting wires and programmable points (switches) to join them. As fault models, stuck-at faults of the wires, and extra-device faults and missing-device faults of the programmable points are considered. We heuristically derive test procedures for the faults and then show their validness and complexity&lt;/p&gt;
</Abstract>
    <CoiStatement>No potential conflict of interest relevant to this article was reported.</CoiStatement>
    <ObjectList>
      <Object Type="keyword">
        <Param Name="value">SRAM chips</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">automatic testing</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">design for testability</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">fault diagnosis</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">field programmable gate arrays</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">integrated circuit interconnections</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">logic testing</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">reconfigurable architectures</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">sequential circuits</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">table lookup</Param>
      </Object>
    </ObjectList>
    <ReferenceList/>
  </Article>
  <Article>
    <Journal>
      <PublisherName/>
      <JournalTitle>Acta Medica Okayama</JournalTitle>
      <Issn/>
      <Volume/>
      <Issue/>
      <PubDate PubStatus="ppublish">
        <Year>2003</Year>
        <Month/>
      </PubDate>
    </Journal>
    <ArticleTitle>Improvement of detectability for CMOS floating gate defects in supply current test</ArticleTitle>
    <FirstPage LZero="delete">406</FirstPage>
    <LastPage>409</LastPage>
    <Language>EN</Language>
    <AuthorList>
      <Author>
        <FirstName EmptyYN="N">Hiroyuki</FirstName>
        <LastName>Michinishi</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Tokumi</FirstName>
        <LastName>Yokohira</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Takuji</FirstName>
        <LastName>Okamoto</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Toshifumi</FirstName>
        <LastName>Kobayashi</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Tsutomu</FirstName>
        <LastName>Hondo</LastName>
        <Affiliation/>
      </Author>
    </AuthorList>
    <PublicationType/>
    <ArticleIdList>
      <ArticleId IdType="doi"/>
    </ArticleIdList>
    <Abstract>&lt;p&gt;We already proposed a supply current test method for detecting floating gate defects in CMOS ICs. In the method, increase of the supply current caused by defects is promoted by superposing a sinusoidal signal on the supply voltage. In this study, we propose one way to improve detectability of the method for the defects. They are detected by analyzing the frequency of supply current and judging whether secondary harmonics of the sinusoidal signal exist or not. Effectiveness of our way is confirmed by some experiments.&lt;/p&gt;
</Abstract>
    <CoiStatement>No potential conflict of interest relevant to this article was reported.</CoiStatement>
    <ObjectList>
      <Object Type="keyword">
        <Param Name="value">CMOS logic circuits</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">built-in self test</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">equivalent circuits</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">integrated circuit testing</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">logic testing</Param>
      </Object>
    </ObjectList>
    <ReferenceList/>
  </Article>
  <Article>
    <Journal>
      <PublisherName/>
      <JournalTitle>Acta Medica Okayama</JournalTitle>
      <Issn/>
      <Volume/>
      <Issue/>
      <PubDate PubStatus="ppublish">
        <Year>2005</Year>
        <Month/>
      </PubDate>
    </Journal>
    <ArticleTitle>A Framework for Mobile Agent Systems with the Capability of Preceding and Following Users</ArticleTitle>
    <FirstPage LZero="delete">89</FirstPage>
    <LastPage>94</LastPage>
    <Language>EN</Language>
    <AuthorList>
      <Author>
        <FirstName EmptyYN="N">Tokumi</FirstName>
        <LastName>Yokohira</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Kiyohiko</FirstName>
        <LastName>Okayama</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Takashi</FirstName>
        <LastName>Murakami</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Kayo</FirstName>
        <LastName>Takarako</LastName>
        <Affiliation/>
      </Author>
    </AuthorList>
    <PublicationType/>
    <ArticleIdList>
      <ArticleId IdType="doi"/>
    </ArticleIdList>
    <Abstract>&lt;p&gt;As one of mobile agent applications, many systems which provide continuous service for users moving on a network have been proposed. In these systems, because a movement of mobile agents is performed after a user movement, users must wait for arrival of mobile agents. To reduce users' waiting time, we propose a fundamental framework for mobile agent systems where an agent can move precedently before a user movement. In our frame-work, it is assumed that computers are connected on a network and users with rewritable devices move on the network. The framework supports precedent movement ofmobile agents based on prediction using movement history of users. Because the prediction may be wrong, the framework also provides the following movement of mobile agents. Moreover, the framework provides a recovery method of mobile agents in service in case that mobile agents disappear due to problems such as their bugs. Because we provide some APIs, via which various functions of our framework are accessed, developers of mobile agent systems can easily use our framework using the APIs. We implemented an experimental agent system using the APIs and confirmed that the framework perforned correctly using the experimental system.&lt;/p&gt;
</Abstract>
    <CoiStatement>No potential conflict of interest relevant to this article was reported.</CoiStatement>
    <ObjectList/>
    <ReferenceList/>
  </Article>
  <Article>
    <Journal>
      <PublisherName/>
      <JournalTitle>Acta Medica Okayama</JournalTitle>
      <Issn/>
      <Volume/>
      <Issue/>
      <PubDate PubStatus="ppublish">
        <Year>2005</Year>
        <Month/>
      </PubDate>
    </Journal>
    <ArticleTitle>A framework for mobile agent systems with the capability of preceding and following users</ArticleTitle>
    <FirstPage LZero="delete">89</FirstPage>
    <LastPage>94</LastPage>
    <Language>EN</Language>
    <AuthorList>
      <Author>
        <FirstName EmptyYN="N">Tokumi</FirstName>
        <LastName>Yokohira</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Kiyohiko</FirstName>
        <LastName>Okayama</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Takashi</FirstName>
        <LastName>Murakami</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Kayo</FirstName>
        <LastName>Takarako</LastName>
        <Affiliation/>
      </Author>
    </AuthorList>
    <PublicationType/>
    <ArticleIdList>
      <ArticleId IdType="doi"/>
    </ArticleIdList>
    <Abstract>&lt;p&gt;As one of mobile agent applications, many systems which provide continuous service for users moving on a network have been proposed. In these systems, because a movement of mobile agents is performed after a user movement, users must wait for arrival of mobile agents. To reduce users' waiting time, we propose a fundamental framework for mobile agent systems where an agent can move precedently before a user movement. In our frame-work, it is assumed that computers are connected on a network and users with rewritable devices move on the network. The framework supports precedent movement ofmobile agents based on prediction using movement history of users. Because the prediction may be wrong, the framework also provides the following movement of mobile agents. Moreover, the framework provides a recovery method of mobile agents in service in case that mobile agents disappear due to problems such as their bugs. Because we provide some APIs, via which various functions of our framework are accessed, developers of mobile agent systems can easily use our framework using the APIs. We implemented an experimental agent system using the APIs and confirmed that the framework perforned correctly using the experimental system.&lt;/p&gt;
</Abstract>
    <CoiStatement>No potential conflict of interest relevant to this article was reported.</CoiStatement>
    <ObjectList/>
    <ReferenceList/>
  </Article>
  <Article>
    <Journal>
      <PublisherName/>
      <JournalTitle>Acta Medica Okayama</JournalTitle>
      <Issn/>
      <Volume>40</Volume>
      <Issue>4</Issue>
      <PubDate PubStatus="ppublish">
        <Year>1991</Year>
        <Month/>
      </PubDate>
    </Journal>
    <ArticleTitle>Fault tolerant packet-switched network design and Its sensitivity</ArticleTitle>
    <FirstPage LZero="delete">452</FirstPage>
    <LastPage>460</LastPage>
    <Language>EN</Language>
    <AuthorList>
      <Author>
        <FirstName EmptyYN="N">Tokumi</FirstName>
        <LastName>Yokohira</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Masashi</FirstName>
        <LastName>Sugano</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Takeshi</FirstName>
        <LastName>Nishida</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Hideo</FirstName>
        <LastName>Miyahara</LastName>
        <Affiliation/>
      </Author>
    </AuthorList>
    <PublicationType/>
    <ArticleIdList>
      <ArticleId IdType="doi"/>
    </ArticleIdList>
    <Abstract>&lt;p&gt;Reliability and performance for telecommunication networks have traditionally been investigated separately in spite of their close relation. A design method integrating them for a reliable packet switched network, called a proofing method, is presented. Two heuristic design approaches (max-average, max-delay-link) for optimizing network cost in the proofing method are described. To verify their effectiveness and applicability, they are compared numerically for three example network topologies. The sensitivity of these two methods is examined with respect to changes in traffic demand and in link reliability. The design sensitivity to variation of input data is examined by changing the predicted probability of link failure, and by increasing the network traffic over the predicted value. The resulting analysis shows relative insensitivity of solutions generated by the two design methods to input data&lt;/p&gt;
</Abstract>
    <CoiStatement>No potential conflict of interest relevant to this article was reported.</CoiStatement>
    <ObjectList>
      <Object Type="keyword">
        <Param Name="value">Packet-switched network</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">Sensitivity</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">Performance</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">    Capacity assignment algorithm.</Param>
      </Object>
    </ObjectList>
    <ReferenceList/>
  </Article>
  <Article>
    <Journal>
      <PublisherName/>
      <JournalTitle>Acta Medica Okayama</JournalTitle>
      <Issn/>
      <Volume/>
      <Issue/>
      <PubDate PubStatus="ppublish">
        <Year>1997</Year>
        <Month/>
      </PubDate>
    </Journal>
    <ArticleTitle>Testing for the programming circuit of LUT-based FPGAs</ArticleTitle>
    <FirstPage LZero="delete">242</FirstPage>
    <LastPage>247</LastPage>
    <Language>EN</Language>
    <AuthorList>
      <Author>
        <FirstName EmptyYN="N">Hiroyuki</FirstName>
        <LastName>Michinishi</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Tokumi</FirstName>
        <LastName>Yokohira</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Takuji</FirstName>
        <LastName>Okamoto</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Tomoo</FirstName>
        <LastName>Inoue</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Hideo</FirstName>
        <LastName>Fujiwara</LastName>
        <Affiliation/>
      </Author>
    </AuthorList>
    <PublicationType/>
    <ArticleIdList>
      <ArticleId IdType="doi"/>
    </ArticleIdList>
    <Abstract>&lt;p&gt;The programming circuit of look-up table based FPGAs consists of two shift registers, a control circuit and a configuration memory (SRAM) cell array. Because the configuration memory cell array can be easily tested by conventional test methods for RAMs, we focus on testing for the shift registers. We show that the testing can be done by using only the faculties of the programming circuit, without using additional hardware&lt;/p&gt;
</Abstract>
    <CoiStatement>No potential conflict of interest relevant to this article was reported.</CoiStatement>
    <ObjectList>
      <Object Type="keyword">
        <Param Name="value">SRAM chips</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">field programmable gate arrays</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">logic CAD</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">logic testing</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">shift registers</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">table lookup</Param>
      </Object>
    </ObjectList>
    <ReferenceList/>
  </Article>
  <Article>
    <Journal>
      <PublisherName/>
      <JournalTitle>Acta Medica Okayama</JournalTitle>
      <Issn/>
      <Volume>4</Volume>
      <Issue/>
      <PubDate PubStatus="ppublish">
        <Year>2001</Year>
        <Month/>
      </PubDate>
    </Journal>
    <ArticleTitle>A minimal-state processing search algorithm for satisfiability problems</ArticleTitle>
    <FirstPage LZero="delete">2769</FirstPage>
    <LastPage>2774</LastPage>
    <Language>EN</Language>
    <AuthorList>
      <Author>
        <FirstName EmptyYN="N">Nobuo</FirstName>
        <LastName>Funabiki</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Tokumi</FirstName>
        <LastName>Yokohira</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Toru</FirstName>
        <LastName>Nakanishi</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Shigeto</FirstName>
        <LastName>Tajima</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Teruo</FirstName>
        <LastName>Higashino</LastName>
        <Affiliation/>
      </Author>
    </AuthorList>
    <PublicationType/>
    <ArticleIdList>
      <ArticleId IdType="doi"/>
    </ArticleIdList>
    <Abstract>&lt;p&gt;The satisfiability problem (SAT) is a typical NP-complete problem where a wide range of applications has been studied. Given a set of variables U and a set of clauses C, the goal of SAT is to find a truth assignment to variables in U such that every clause in C is satisfied if it exits, or to derive the infeasibility otherwise. This paper presents an approximation algorithm, called a minimal-state processing search algorithm for SAT (MIPS-SAT). MIPS-SAT repeatedly transits minimal states in terms of the cost function for searching a solution through a construction stage and a refinement stage. The first stage greedily generates an initial state composed of as many satisfied clauses as possible. The second stage iteratively seeks a solution while keeping state minimality. The performance of MIPS-SAT is verified through solving DIMACS benchmark instances&lt;/p&gt;
</Abstract>
    <CoiStatement>No potential conflict of interest relevant to this article was reported.</CoiStatement>
    <ObjectList>
      <Object Type="keyword">
        <Param Name="value">SAT</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">heuristic algorithm</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">optimization</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">DIMACS</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">   MIPS_SAT.</Param>
      </Object>
    </ObjectList>
    <ReferenceList/>
  </Article>
  <Article>
    <Journal>
      <PublisherName/>
      <JournalTitle>Acta Medica Okayama</JournalTitle>
      <Issn/>
      <Volume/>
      <Issue/>
      <PubDate PubStatus="ppublish">
        <Year>1994</Year>
        <Month/>
      </PubDate>
    </Journal>
    <ArticleTitle>Minimum test sets for locally exhaustive testing of combinational circuits with five outputs</ArticleTitle>
    <FirstPage LZero="delete">280</FirstPage>
    <LastPage>285</LastPage>
    <Language>EN</Language>
    <AuthorList>
      <Author>
        <FirstName EmptyYN="N">Tokumi</FirstName>
        <LastName>Yokohira</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Toshimi</FirstName>
        <LastName>Shimizu</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Hiroyuki</FirstName>
        <LastName>Michinishi</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Yuji</FirstName>
        <LastName>Sugiyama</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Takuji</FirstName>
        <LastName>Okamoto</LastName>
        <Affiliation/>
      </Author>
    </AuthorList>
    <PublicationType/>
    <ArticleIdList>
      <ArticleId IdType="doi"/>
    </ArticleIdList>
    <Abstract>&lt;p&gt;In this paper, features of dependence matrices of combinational circuits with five outputs are discussed, and it is shown that a minimum test set for locally exhaustive testing of such circuits always has 2 w test patterns, where w is the maximum number of inputs on which any output depends&lt;/p&gt;
</Abstract>
    <CoiStatement>No potential conflict of interest relevant to this article was reported.</CoiStatement>
    <ObjectList>
      <Object Type="keyword">
        <Param Name="value">combinational circuits</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">logic testing</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">matrix algebra</Param>
      </Object>
    </ObjectList>
    <ReferenceList/>
  </Article>
  <Article>
    <Journal>
      <PublisherName/>
      <JournalTitle>Acta Medica Okayama</JournalTitle>
      <Issn/>
      <Volume/>
      <Issue/>
      <PubDate PubStatus="ppublish">
        <Year>1992</Year>
        <Month/>
      </PubDate>
    </Journal>
    <ArticleTitle>Minimum Verification test set for combinational circuit</ArticleTitle>
    <FirstPage LZero="delete">14</FirstPage>
    <LastPage>19</LastPage>
    <Language>EN</Language>
    <AuthorList>
      <Author>
        <FirstName EmptyYN="N">Hiroyuki</FirstName>
        <LastName>Michinishi</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Tokumi</FirstName>
        <LastName>Yokohira</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Takuji</FirstName>
        <LastName>Okamoto</LastName>
        <Affiliation/>
      </Author>
    </AuthorList>
    <PublicationType/>
    <ArticleIdList>
      <ArticleId IdType="doi"/>
    </ArticleIdList>
    <Abstract>&lt;p&gt;A sufficient condition under which a minimum verification test set (MVTS) for a combinational circuit has 2w elements is derived, where w is the maximum number of inputs on which any output depends, and an algorithm to find an NVTS with 2w elements for any CUT with up to four outputs is described&lt;/p&gt;
</Abstract>
    <CoiStatement>No potential conflict of interest relevant to this article was reported.</CoiStatement>
    <ObjectList>
      <Object Type="keyword">
        <Param Name="value">automatic testing</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">built-in self test</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">combinatorial circuits</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">logic testing</Param>
      </Object>
    </ObjectList>
    <ReferenceList/>
  </Article>
  <Article>
    <Journal>
      <PublisherName/>
      <JournalTitle>Acta Medica Okayama</JournalTitle>
      <Issn/>
      <Volume/>
      <Issue/>
      <PubDate PubStatus="ppublish">
        <Year>1996</Year>
        <Month/>
      </PubDate>
    </Journal>
    <ArticleTitle>A test methodology for interconnect structures of LUT-based FPGAs</ArticleTitle>
    <FirstPage LZero="delete">68</FirstPage>
    <LastPage>74</LastPage>
    <Language>EN</Language>
    <AuthorList>
      <Author>
        <FirstName EmptyYN="N">Hiroyuki</FirstName>
        <LastName>Michinishi</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Tokumi</FirstName>
        <LastName>Yokohira</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Takuji</FirstName>
        <LastName>Okamoto</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Tomoo</FirstName>
        <LastName>Inoue</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Hideo</FirstName>
        <LastName>Fujiwara</LastName>
        <Affiliation/>
      </Author>
    </AuthorList>
    <PublicationType/>
    <ArticleIdList>
      <ArticleId IdType="doi"/>
    </ArticleIdList>
    <Abstract>&lt;p&gt;In this paper we consider testing for programmable interconnect structures of look-up table based FPGAs. The interconnect structure considered in the paper consists of interconnecting wires and programmable points (switches) to join them. As fault models, stuck-at faults of the wires, and extra-device faults and missing-device faults of the programmable points are considered. We heuristically derive test procedures for the faults and then show their validness and complexity&lt;/p&gt;
</Abstract>
    <CoiStatement>No potential conflict of interest relevant to this article was reported.</CoiStatement>
    <ObjectList>
      <Object Type="keyword">
        <Param Name="value">SRAM chips</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">automatic testing</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">design for testability</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">fault diagnosis</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">field programmable gate arrays</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">integrated circuit interconnections</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">logic testing</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">reconfigurable architectures</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">sequential circuits</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">table lookup</Param>
      </Object>
    </ObjectList>
    <ReferenceList/>
  </Article>
  <Article>
    <Journal>
      <PublisherName/>
      <JournalTitle>Acta Medica Okayama</JournalTitle>
      <Issn/>
      <Volume/>
      <Issue/>
      <PubDate PubStatus="ppublish">
        <Year>1993</Year>
        <Month/>
      </PubDate>
    </Journal>
    <ArticleTitle>Proof that akers' algorithm for locally exhaustive testing gives minimum test sets of combinational circuits with up to four outputs</ArticleTitle>
    <FirstPage LZero="delete">14</FirstPage>
    <LastPage>19</LastPage>
    <Language>EN</Language>
    <AuthorList>
      <Author>
        <FirstName EmptyYN="N">Hiroyuki</FirstName>
        <LastName>Michinishi</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Tokumi</FirstName>
        <LastName>Yokohira</LastName>
        <Affiliation/>
      </Author>
      <Author>
        <FirstName EmptyYN="N">Takuji</FirstName>
        <LastName>Okamoto</LastName>
        <Affiliation/>
      </Author>
    </AuthorList>
    <PublicationType/>
    <ArticleIdList>
      <ArticleId IdType="doi"/>
    </ArticleIdList>
    <Abstract>&lt;p&gt;In this paper, we prove that Akers' test generation algorithm for the locally exhaustive testing gives a minimum test set (MLTS) for every combinational circuit (CUT) with up to four outputs. That is, we clarify that Akers' test pattern generator can generate an MLTS for such CUT&lt;/p&gt;
</Abstract>
    <CoiStatement>No potential conflict of interest relevant to this article was reported.</CoiStatement>
    <ObjectList>
      <Object Type="keyword">
        <Param Name="value">automatic testing</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">built-in self test</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">combinational circuits</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">logic testing</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">matrix algebra</Param>
      </Object>
      <Object Type="keyword">
        <Param Name="value">minimisation</Param>
      </Object>
    </ObjectList>
    <ReferenceList/>
  </Article>
  <Article>
    <Journal>
      <PublisherName>Faculty of Engineering, Okayama University</PublisherName>
      <JournalTitle>Acta Medica Okayama</JournalTitle>
      <Issn>0475-0071</Issn>
      <Volume>24</Volume>
      <Issue>2</Issue>
      <PubDate PubStatus="ppublish">
        <Year>1990</Year>
        <Month/>
      </PubDate>
    </Journal>
    <ArticleTitle>Functional Testing of an ALU</ArticleTitle>
    <FirstPage LZero="delete">89</FirstPage>
    <LastPage>98</LastPage>
    <Language>EN</Language>
    <AuthorList>
      <Author>
        <FirstName EmptyYN="N">Tokumi</FirstName>
        <LastName>Yokohira</LastName>
        <Affiliation/>
      </Author>
    </AuthorList>
    <PublicationType/>
    <ArticleIdList>
      <ArticleId IdType="doi">10.18926/15505</ArticleId>
    </ArticleIdList>
    <Abstract>This paper considers a test set for an ALU with look ahead carry generators(LCGs). The ALU is logically partitioned into two groups of blocks, the group of one-bit operation units and LCG group. Each group is tested in parallel and exhaustively, independent of the other. And an easily testable design is applied to several blocks for decreasing the number of the input combinations of them. Under the easily testable design, a minimum test set for each group is generated, and the upper and lower bounds for
a minimum test for the ALU are derived. The difference of the lower and upper bounds is not large, and a test set whose number of test vectors is equal to the upper bound can be easily obtained as the union of minimum test sets for two groups. Hence, the union can be used as a complete and practical test set for the ALU.</Abstract>
    <CoiStatement>No potential conflict of interest relevant to this article was reported.</CoiStatement>
    <ObjectList/>
    <ReferenceList/>
  </Article>
</ArticleSet>
