JaLCDOI | 10.18926/15503 |
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FullText URL | Mem_Fac_Eng_OU_25_2_9.pdf |
Author | Mikuni, Masato| Hida, Moritaka| Nishida, Norihide| Sakakibara, Akira| Yamada, Masuo| |
Abstract | Strains induced in the Si substrates by TiN film were observed with X-ray topography. The image of the sample with TiN film 0.45μm thick was like that of a dislocation loop observed with transmission electron microscope. The images of the samples with TiN films 1.65, and 1.9μm thick were different; blackening spreaded in the <112> and <110> direction from the ring contrast in shape of four-lobed rosette pattern. Spreading extended 1.6 times longer than the radius of the ring contrast along the <112> direction. The strain field extended 0.1μm in depth from the top surface where TiN was plated. From the topographs of bent Si beam, it was found that the blackness was almost proportional to the strain. The strains induced by TiN film locally ion-plated were smaller than those observed previously when TiN was ion-plated on the whole top surface of the substrate. Fine structures were observed in the topographs which could not be explained by the kinematical theory. |
Publication Title | Memoirs of the Faculty of Engineering, Okayama University |
Published Date | 1991-03-28 |
Volume | volume25 |
Issue | issue2 |
Start Page | 9 |
End Page | 15 |
ISSN | 0475-0071 |
language | 英語 |
File Version | publisher |
NAID | 120002307429 |
JaLCDOI | 10.18926/15402 |
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FullText URL | Mem_Fac_Eng_OU_30_2_27.pdf |
Author | Totsuji, Hiroo| Kishimoto, Tokunari| Totsuji, Chieko| |
Abstract | The behavior of the Yukawa system in external one-dimensional force fields is analyzed by the molecular dynamics simulation. The formation of layered structures at low temperatures is observed and the relation between the number of layers and characteristic parameters of the system is obtained. Since the Yukawa system serves as a model of clouds of dust particles in plasmas (dusty plasma) which play an important role in plasma processes of semiconductor engineering, the results may be useful to control the quality of semiconductor wafers in such processes. In simulations, periodic boundary conditions are imposed in two dimensions and deformations of periodic boundaries are allowed in order to reduce the effect of boundaries without giving too much constraint on the symmetry. |
Publication Title | Memoirs of the Faculty of Engineering, Okayama University |
Published Date | 1996-03-29 |
Volume | volume30 |
Issue | issue2 |
Start Page | 27 |
End Page | 37 |
ISSN | 0475-0071 |
language | 英語 |
File Version | publisher |
NAID | 120002307582 |
Author | Faculty of Engineering, Okayama University| |
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Published Date | 2004-03 |
Publication Title | Memoirs of the Faculty of Engineering, Okayama University |
Volume | volume38 |
Issue | issue1-2 |
Content Type | Others |
Author | Faculty of Engineering, Okayama University| |
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Published Date | 2002-03 |
Publication Title | Memoirs of the Faculty of Engineering, Okayama University |
Volume | volume36 |
Issue | issue2 |
Content Type | Others |
Author | Faculty of Engineering, Okayama University| |
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Published Date | 2001-12 |
Publication Title | Memoirs of the Faculty of Engineering, Okayama University |
Volume | volume36 |
Issue | issue1 |
Content Type | Others |
Author | Faculty of Engineering, Okayama University| |
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Published Date | 2002-11 |
Publication Title | Memoirs of the Faculty of Engineering, Okayama University |
Volume | volume37 |
Issue | issue1 |
Content Type | Others |
Author | Faculty of Engineering, Okayama University| |
---|---|
Published Date | 2003-03 |
Publication Title | Memoirs of the Faculty of Engineering, Okayama University |
Volume | volume37 |
Issue | issue2 |
Content Type | Others |
Author | Faculty of Engineering, Okayama University| |
---|---|
Published Date | 2004-03 |
Publication Title | Memoirs of the Faculty of Engineering, Okayama University |
Volume | volume38 |
Issue | issue1-2 |
Content Type | Others |
Author | Faculty of Engineering, Okayama University| |
---|---|
Published Date | 2002-03 |
Publication Title | Memoirs of the Faculty of Engineering, Okayama University |
Volume | volume36 |
Issue | issue2 |
Content Type | Others |
Author | Faculty of Engineering, Okayama University| |
---|---|
Published Date | 2003-03 |
Publication Title | Memoirs of the Faculty of Engineering, Okayama University |
Volume | volume37 |
Issue | issue2 |
Content Type | Others |
Author | Faculty of Engineering, Okayama University| |
---|---|
Published Date | 2001-12 |
Publication Title | Memoirs of the Faculty of Engineering, Okayama University |
Volume | volume36 |
Issue | issue1 |
Content Type | Others |
Author | Faculty of Engineering, Okayama University| |
---|---|
Published Date | 2002-11 |
Publication Title | Memoirs of the Faculty of Engineering, Okayama University |
Volume | volume37 |
Issue | issue1 |
Content Type | Others |