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ID 34152
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Author
Duda, L C
Schmitt, T
Mangnuson, M
Forsberg, J
Olsson, A
Nordgren, J.
Okada, K
Kotani, A
Abstract

We report high-resolution polarization-dependent resonant inelastic x-ray scattering (RIXS) at the O K resonance of NiO showing a rich excitation spectrum. We perform multisite Ni6O19 cluster model calculations, revealing that solid state effects are substantial. We identify a nonlocal charge transfer excitation at 4-5 eV and double-singlet creation at 1.75 eV, both exhibiting significant scattering geometry dependence. Apart from an intense band of local charge transfer excitations (above 5 eV) also dd excitations at 1 eV are observed. Finally, we point out that O K RIXS of correlated metal oxides allows a quantitative and consistent determination of the charge transfer energy Delta and the Hund coupling energy J(H).

Keywords
transition-meal compounds
electronic-structure
raman-scattering
emission-spectroscopy
spectra
absorption
coo
Note
Digital Object Identifer:10.1103/PhysRevLett.96.067402
Published with permission from the copyright holder. This is the institute's copy, as published in Physical Review Letters, February 2006, Volume 96, Issue 6, Pages 4.
Publisher URL:http://dx.doi.org/10.1103/PhysRevLett.96.067402
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Copyright © 2006 The American Physical Society. All rights reserved.
Published Date
2006-2
Publication Title
Physical Review Letters
Volume
volume96
Issue
issue6
Content Type
Journal Article
language
英語
Refereed
True
DOI
Web of Sience KeyUT
Submission Path
physics_general/10